Ashok Nandigam. High-Speed Functional Clocks Impact on Vmin (Minimum Operating Voltage) During Scan Testing and Methods to Reduce Vmin. IJCESEN [Internet]. 2026 Mar. 27 [cited 2026 Jun. 6];12(1). Available from: https://www.ijcesen.com/index.php/ijcesen/article/view/5085