Motamarri Venkata Saikumar, Fazal Noorbasha, K. Srinivasa Rao, K. Girija Sravani. Enhancing Fault Detection in Digital Circuits Using Machine Learning and LFSR-Based Test Pattern Generation . IJCESEN [Internet]. 2025 Aug. 6 [cited 2025 Sep. 1];11(3). Available from: https://www.ijcesen.com/index.php/ijcesen/article/view/3231