Ashok Nandigam. “High-Speed Functional Clocks Impact on Vmin (Minimum Operating Voltage) During Scan Testing and Methods to Reduce Vmin”. International Journal of Computational and Experimental Science and Engineering 12, no. 1 (March 27, 2026). Accessed June 6, 2026. https://www.ijcesen.com/index.php/ijcesen/article/view/5085.