Motamarri Venkata Saikumar, Fazal Noorbasha, K. Srinivasa Rao, and K. Girija Sravani. “Enhancing Fault Detection in Digital Circuits Using Machine Learning and LFSR-Based Test Pattern Generation ”. International Journal of Computational and Experimental Science and Engineering 11, no. 3 (August 6, 2025). Accessed September 1, 2025. https://www.ijcesen.com/index.php/ijcesen/article/view/3231.