MANGUKIYA, Milan. Advanced testing and validation frameworks for high-reliability multi-board electronic systems. International Journal of Computational and Experimental Science and Engineering, [S. l.], v. 12, n. 1, 2026. DOI: 10.22399/ijcesen.4719. Disponível em: https://www.ijcesen.com/index.php/ijcesen/article/view/4719. Acesso em: 18 jan. 2026.