MOTAMARRI VENKATA SAIKUMAR; FAZAL NOORBASHA; K. SRINIVASA RAO; K. GIRIJA SRAVANI. Enhancing Fault Detection in Digital Circuits Using Machine Learning and LFSR-Based Test Pattern Generation . International Journal of Computational and Experimental Science and Engineering, [S. l.], v. 11, n. 3, 2025. DOI: 10.22399/ijcesen.3231. Disponível em: https://www.ijcesen.com/index.php/ijcesen/article/view/3231. Acesso em: 1 sep. 2025.